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Small Delay Fault Model for Intra-Gate Resistive Open Defects.

Masayuki AraiAkifumi SutoKazuhiko IwasakiKatsuyuki NakanoMichihiro ShintaniKazumi HatayamaTakashi Aikyo
Published in: VTS (2009)
Keyphrases
  • fault model
  • defect detection
  • fault injection
  • thin film transistor