On the phase analysis of multi-carrier signals for high-precision fault detection by reflectometry.
Esteban CabanillasChristophe LayerMoussa KafalPublished in: IEEE SENSORS (2017)
Keyphrases
- high precision
- fault detection
- high recall
- high accuracy
- achieve high precision
- high reliability
- fault diagnosis
- constraint satisfaction
- genetic programming
- artificial neural networks
- data analysis
- condition monitoring
- industrial processes
- failure detection
- fault detection and diagnosis
- fault identification
- neural network