Login / Signup
An investigation of drain pulse induced hot carrier degradation in n-type low temperature polycrystalline silicon thin film transistors.
Meng Zhang
Mingxiang Wang
Published in:
Microelectron. Reliab. (2010)
Keyphrases
</>
thin film
high density
solar cell
plasma etching
low density
chemical vapor deposition
short circuit
grain size
data center
field effect transistors
electron microscopy
room temperature
power consumption
white light interferometry
databases
silicon nitride
software development