Defect Characterization and Testing of Skyrmion-Based Logic Circuits.

Ziqi Zhou Ujjwal Guin Peng Li Vishwani D. Agrawal

Published in: VTS (2021)

Keyphrases

logic circuits
low power
tunnel diode
functional decomposition
gate array
test cases
defect detection
image processing
high speed
power consumption
query language
low cost
distributed systems
pattern matching
efficient implementation
logic synthesis