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dielectric layer sputtered with TiN or ZrN for sandwich-like metal-insulator-metal capacitors.

P. C. JuanK. C. LinH. Y. ChuY. C. KuoH. W. WangT. Y. Shih
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • high temperature
  • silicon dioxide
  • chemical vapor deposition
  • space charge
  • metal oxide
  • high density
  • field effect transistors
  • data sets
  • decision trees
  • database systems