Merit based directed random test generation (MDRTG) scheme for combinational circuits.

Arezoo Kamran Mohammad Saeed Jahangiry Zainalabedin Navabi

Published in: EWDTS (2010)

Keyphrases

test generation
test cases
test sequences
logic circuits
symbolic execution
design automation
data sets
image processing
asynchronous circuits
high speed
information systems
training data
static analysis
quality assurance
code coverage
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