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Faulty TSVs identification and recovery in 3D stacked ICs during pre-bond testing.
Surajit Kumar Roy
Sobitri Chatterjee
Chandan Giri
Hafizur Rahaman
Published in:
3DIC (2013)
Keyphrases
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fault model
neural network
image sequences
software testing
automatic identification
test generation
parameter identification
recovery algorithm
normal operation
real world
information retrieval
image processing
website
fault diagnosis