Login / Signup
Thermal-uniformity-aware X-filling to reduce temperature-induced delay variation for accurate at-speed testing.
Tomokazu Yoneda
Michiko Inoue
Yasuo Sato
Hideo Fujiwara
Published in:
VTS (2010)
Keyphrases
</>
thermal imaging
high temperature
thermal conductivity
infrared
real time
room temperature
bandwidth consumption
air temperature
high speed
test cases
control system
high accuracy
significantly reduced
highly accurate
surface temperature
heat transfer
test set
high quality
learning algorithm