Login / Signup
Possibilities of defect-size magnification for testing resistive-opens in nanometer technologies.
Jose Luis Garcia-Gervacio
Jaime Martínez-Castillo
Víctor H. Champac
Published in:
LATW (2014)
Keyphrases
</>
high resolution
real time
memory requirements
scales linearly
real world
data mining
database systems
high quality
test cases
spatial resolution
small size
fixed size
emerging technologies
defect detection
electron microscopy