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Improved Launch for Higher TDF Coverage With Fewer Test Patterns.

Youhua ShiNozomu TogawaMasao YanagisawaTatsuo Ohtsuki
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2010)
Keyphrases
  • test suite
  • pattern analysis
  • search engine
  • frequent patterns
  • real world
  • data mining
  • case study
  • relational databases
  • pattern discovery
  • statistical tests
  • similar patterns