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Improved Launch for Higher TDF Coverage With Fewer Test Patterns.
Youhua Shi
Nozomu Togawa
Masao Yanagisawa
Tatsuo Ohtsuki
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2010)
Keyphrases
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test suite
pattern analysis
search engine
frequent patterns
real world
data mining
case study
relational databases
pattern discovery
statistical tests
similar patterns