Impact of nano-scale through-silicon vias on the quality of today and future 3D IC designs.

Daehyun Kim Suyoun Kim Sung Kyu Lim

Published in: SLIP (2011)

Keyphrases

nano scale
integrated circuit
high density
high quality
long term
higher quality
real world
neural network
high impact
high speed
low quality
silicon dioxide
real time
current status
information systems
databases
data sets