A reusable BIST with software assisted repair technology for improved memory and IO debug, validation and test time.
Bruce QuerbachRahul KhannaDavid BlankenbecklerYulan ZhangRonald T. AndersonDavid G. EllisZale T. SchoenbornSabyasachi DeyatiPatrick ChiangPublished in: ITC (2014)
Keyphrases
- software systems
- test cases
- software components
- computer systems
- software testing
- software reuse
- software development
- personal computer
- model based testing
- built in self test
- test data generation
- test suite
- computer hardware
- case study
- graphical user interfaces
- enabling technology
- web enabled
- regression testing
- technical issues
- high end
- data processing
- data flow
- software tools
- software architecture
- intellectual property
- software design
- software maintenance
- damage assessment
- distributed shared memory
- information systems
- memory requirements
- source code
- software engineering
- object oriented
- computer aided software engineering
- cyber infrastructure
- integrity constraints