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AC-Plus Scan Methodology for Small Delay Testing and Characterization.

Tsung-Yeh LiShi-Yu HuangHsuan-Jung HsuChao-Wen TzengChih-Tsun HuangJing-Jia LiouHsi-Pin MaPo-Chiun HuangJenn-Chyou BorChing-Cheng TienChi-Hu WangCheng-Wen Wu
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2013)
Keyphrases
  • small number
  • test cases
  • control system
  • steady state
  • website
  • database systems
  • multiscale
  • binary images
  • test suite
  • critical path