Degradation in P-type Poly-Si Thin-Film Transistors under Pulse Bias Stresses.

Yining Yu Dongli Zhang Mingxiang Wang Huaisheng Wang

Published in: ICICDT (2019)

Keyphrases

thin film
solar cell
high density
chance discovery
chemical vapor deposition
plasma etching
short circuit
electron microscopy
grain size
database systems
fuzzy logic
integrated circuit
circuit design
low density
room temperature
film thickness