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The need for multi-scale approaches in Cu/low-k reliability issues.
Cadmus A. Yuan
Olaf van der Sluis
Willem D. van Driel
G. Q. (Kouchi) Zhang
Published in:
Microelectron. Reliab. (2008)
Keyphrases
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multiscale
neural network
wavelet transform
strengths and weaknesses
real world
genetic algorithm
database systems
edge detection
key issues
alternative approaches
design choices