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The need for multi-scale approaches in Cu/low-k reliability issues.

Cadmus A. YuanOlaf van der SluisWillem D. van DrielG. Q. (Kouchi) Zhang
Published in: Microelectron. Reliab. (2008)
Keyphrases
  • multiscale
  • neural network
  • wavelet transform
  • strengths and weaknesses
  • real world
  • genetic algorithm
  • database systems
  • edge detection
  • key issues
  • alternative approaches
  • design choices