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A Feature Memory Rearrangement Network for Visual Inspection of Textured Surface Defects Toward Edge Intelligent Manufacturing.
Haiming Yao
Wenyong Yu
Xue Wang
Published in:
IEEE Trans Autom. Sci. Eng. (2023)
Keyphrases
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visual inspection
printed circuit boards
surface defects
image analysis
machine vision
quality control
wireless sensor networks
image features
peer to peer
complex networks
surface inspection
laser scanning
fluorescence microscopy images
machine learning
textural features
input image
feature vectors
computer vision