Huffman encoding of test sets for sequential circuits.
Vikram IyengarKrishnendu ChakrabartyBrian T. MurrayPublished in: IEEE Trans. Instrum. Meas. (1998)
Keyphrases
- test set
- error rate
- training set
- test data
- evaluation methodology
- training data
- high speed
- fractal image compression
- random selection
- logic circuits
- image processing
- arithmetic coding
- database
- encoding scheme
- digital circuits
- delay insensitive
- analog vlsi
- circuit design
- variable length
- image quality
- pairwise
- feature space
- decision trees
- data sets