A Built-in Self-Test Scheme for TSVs of Logic-DRAM Stacked 3D ICs.

Wei-Hsuan Yang Jin-Fu Li Chun-Lung Hsu Chi-Tien Sun Shih-Hsu Huang

Published in: 3DIC (2019)

Keyphrases

built in self test
integrated circuit
main memory
classification scheme
learning scheme
detection scheme
logical framework
modal logic
high density
automated reasoning
predicate logic
recognition scheme