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Delay fault testing and silicon debug using scan chains.

Ramyanshu DattaAntony SebastineJacob A. Abraham
Published in: ETS (2004)
Keyphrases
  • fault model
  • fault detection
  • fault diagnosis
  • fault injection
  • real time
  • high speed
  • test cases
  • low cost
  • software testing
  • real time embedded systems