Complete test-set generation for bridging faults in combinational-logic circuits.
Sanjoy Kumar BasuJogesh Chandra PaulPramode Ranjan BhattacharjeePublished in: Inf. Sci. (1986)
Keyphrases
- test set
- logic circuits
- low power
- error rate
- test cases
- training set
- functional decomposition
- test data
- training data
- gate array
- high speed
- fault diagnosis
- logic synthesis
- low cost
- evaluation methodology
- tunnel diode
- class distribution
- power dissipation
- computer vision
- power consumption
- neural network
- face recognition
- learning algorithm
- machine learning
- database