Leakage Current in Deep-Submicron CMOS Circuits.
Kaushik RoySaibal MukhopadhyayHamid Mahmoodi-MeimandPublished in: J. Circuits Syst. Comput. (2002)
Keyphrases
- vlsi circuits
- leakage current
- low voltage
- mixed signal
- cmos technology
- low power
- delay insensitive
- power line
- analog vlsi
- high speed
- power dissipation
- random access memory
- design considerations
- power consumption
- circuit design
- silicon dioxide
- low cost
- multi channel
- parallel processing
- electrical properties
- digital circuits
- integrated circuit