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Model-Based Mutation Testing of an Industrial Measurement Device.
Bernhard K. Aichernig
Jakob Auer
Elisabeth Jöbstl
Robert Korosec
Willibald Krenn
Rupert Schlick
Birgit Vera Schmidt
Published in:
TAP@STAF (2014)
Keyphrases
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mutation testing
test sequences
database applications
test generation
industrial applications
data acquisition
test suite
measurement data
test cases
databases
finite state machines
data sets
artificial intelligence
learning algorithm
integration testing
software maintenance
three dimensional
neural network