Automatic test program generation for pipelined processors.

Hiroaki Iwashita Satoshi Kowatari Tsuneo Nakata Fumiyasu Hirose

Published in: ICCAD (1994)

Keyphrases

test cases
parallel processing
semi automatic
parallel algorithm
fully automatic
learning algorithm
test data
data flow
test suite
generation process
search algorithm
data driven
statistical significance
static analysis
test data generation
advanced research projects agency