Login / Signup
CMOS fault modeling, test generation and design for testability.
C. Matthäus
B. Krüger-Sprengel
C. Glowacz
Uwe Hübner
Heinrich Theodor Vierhaus
Published in:
Microprocess. Microprogramming (1988)
Keyphrases
</>
test generation
design automation
software testing
circuit design
learning algorithm
low cost
object oriented
test cases