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Test Pattern Selection and Compaction for Sequential Circuits in an HDL Environment.

M. H. HaghbayanSara KaramatiFatemeh JavaheriZainalabedin Navabi
Published in: Asian Test Symposium (2010)
Keyphrases
  • pattern matching
  • real time
  • indoor environments
  • mobile robot
  • high speed
  • test data
  • database
  • search engine
  • hidden markov models
  • low cost
  • complex environments
  • design methodology
  • pattern detection
  • built in self test