Login / Signup

The role of surface barrier oxidation on AlGaN/GaN HEMTs reliability.

Milan TapajnaNicole KillatUttiya ChowdhuryJose L. JimenezMartin Kuball
Published in: Microelectron. Reliab. (2012)
Keyphrases
  • three dimensional
  • cross section
  • surface fitting
  • data sets
  • d objects
  • level set
  • range data
  • structuring elements
  • smooth surfaces
  • error detection