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Low-cost protection for SER upsets and silicon defects.
Mojtaba Mehrara
Mona Attariyan
Smitha Shyam
Kypros Constantinides
Valeria Bertacco
Todd M. Austin
Published in:
DATE (2007)
Keyphrases
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low cost
hardware and software
low power
real time
defect detection
digital camera
data acquisition
highly efficient
information security
privacy protection
protection scheme
automated visual inspection
image processing
database
digital images
machine vision
critical infrastructure
defect classification