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Thermal-Aware Test Access Mechanism and Wrapper Design Optimization for System-on-Chips.

Thomas Edison YuTomokazu YonedaKrishnendu ChakrabartyHideo Fujiwara
Published in: IEICE Trans. Inf. Syst. (2008)
Keyphrases
  • feature selection
  • infrared
  • test cases
  • test data
  • databases
  • computational model
  • selection mechanism
  • information retrieval
  • web pages
  • information access
  • random access
  • remote access