Test-set embedding based on width compression for mixed-mode BIST.
Krishnendu ChakrabartySunil R. DasPublished in: IEEE Trans. Instrum. Meas. (2000)
Keyphrases
- test set
- mixed mode
- error rate
- training set
- training data
- image compression
- test data
- watermark embedding
- test cases
- code generation
- evaluation methodology
- data integration
- frontal face
- face detector
- data hiding
- watermarking algorithm
- life cycle
- database
- user interface
- case study
- image processing
- learning algorithm
- data mining