Login / Signup

Molecular simulation on the material/interfacial strength of the low-dielectric materials.

Cadmus A. YuanOlaf van der SluisG. Q. (Kouchi) ZhangLeo J. ErnstWillem D. van DrielRichard B. R. van Silfhout
Published in: Microelectron. Reliab. (2007)
Keyphrases