Random Illumination Microscopy from Variance Images.
Simon LabouesseJérôme IdierAnne SentenacThomas MangeatMarc AllainPublished in: EUSIPCO (2020)
Keyphrases
- image analysis
- illumination conditions
- lighting conditions
- imaging conditions
- image database
- image data
- image retrieval
- three dimensional
- input image
- object recognition
- image classification
- transformed images
- pixel intensities
- edge detection
- illumination correction
- image features
- viewpoint
- electron microscopy
- viewing angle
- viewing conditions
- image registration
- illumination invariant
- partial occlusion
- outdoor scenes
- varying illumination conditions
- image set
- image matching
- x ray