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High-Temperature Characterization of Novel Silicon-Based Substrate Solutions for RF-IC Applications.
Quentin Courte
M. Rack
M. Nabet
Pieter Cardinael
Jean-Pierre Raskin
Published in:
ESSDERC (2021)
Keyphrases
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high temperature
silicon dioxide
high speed
optimal solution
low cost
integrated circuit
high density
magnetic recording
real time
neural network
feasible solution
solution quality
radio frequency
semiconductor devices
rf sputtering