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Revisiting response compaction in space for full-scan circuits with nonexhaustive test sets using concept of sequence characterization.

Sunil R. DasChittoor V. RamamoorthyMansour H. AssafEmil M. PetriuWen-Ben JoneMehmet Sahinoglu
Published in: IEEE Trans. Instrum. Meas. (2005)
Keyphrases
  • test set
  • error rate
  • training set
  • training data
  • high speed
  • test data
  • search space
  • low dimensional
  • data sets
  • neural network
  • feature selection
  • input data
  • test cases
  • evaluation methodology