LOW ERROR
Experts
- Amir H. Banihashemi
- Irit Dinur
- Prahladh Harsha
- Dean Doron
- Amnon Ta-Shma
- Avraham Ben-Aroya
- Reza Asvadi
- Noor Mohammad S.
- Bhaskara Rao Jammu
- Bashirreza Karimi
- Cheuk Ting Li
- Guy Kindler
- Martin Aumüller
- L. Guna Sekhar Sai Harsha
- Paul H. Siegel
- Abbas El Gamal
- Christian Janos Lebeda
- Gianluigi Liva
- Xiaojie Zhang
- Keshab K. Parhi
- Sreehari Veeramachaneni
- Rasmus Pagh
- Mahmoud Ahmadian-Attari
- Tom Bylander
- Brandon Lloyd
- Chip-Hong Chang
- Anders Søgaard
- Chinwei Huang
- Don J. Torrieri
- Saher Esmeir
- Chao Ma
- Ilker Hamzaoglu
- Nalini Bodasingi
- Xiongfei Tao
- Jun Wang
- Jiajie Tong
- Chih-Chun Wang
- Zhiyong He
- Shin-Kai Chen
Venues
- CoRR
- IEEE Trans. Commun.
- IEEE Trans. Circuits Syst. II Express Briefs
- IEEE Commun. Lett.
- ISIT
- Sensors
- Electron. Colloquium Comput. Complex.
- IEEE Trans. Instrum. Meas.
- ICC
- ISCAS
- IEEE Trans. Very Large Scale Integr. Syst.
- IEEE Trans. Circuits Syst. I Regul. Pap.
- STOC
- IET Signal Process.
- ICASSP
- Circuits Syst. Signal Process.
- IEEE Access
- ICECS
- FOCS
- IEEE Trans. Wirel. Commun.
- ISWCS
- SMC
- SIAM J. Comput.
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- ECCTD
- IEEE Trans. Veh. Technol.
- Graphics Hardware
- Computational Complexity Conference
- Pattern Recognit.
- COLT/EuroCOLT
- SODA
- ILP
- ICLR
- PRIME
- EUSIPCO
- Microprocess. Microsystems
- SoCC
- Digit. Signal Process.
- Signal Process.
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