LAMBERTIAN REFLECTANCE
Experts
- Edwin R. Hancock
- Hiroyuki Ukida
- Toshikazu Wada
- Takashi Matsuyama
- Shengbiao Wu
- Ravi Ramamoorthi
- Eugene Fiume
- Yves M. Govaerts
- Daniel Pak-Kong Lun
- Jianguang Wen
- Nuno Gonçalves
- Tokiichiro Takahashi
- Rene Sepúlveda
- Shenlong Wang
- Steven W. Zucker
- Diogo Roxo
- Michael S. Langer
- Chu-Tak Li
- Toshimitsu Tanaka
- João Pedro Barreto
- Hossein Ragheb
- Qiang Liu
- Yong Chul Ju
- Li-Wen Wang
- Tianhang Cheng
- Benjamin Ummenhofer
- Yixing Lao
- Wan-Chi Siu
- Andrés Bruhn
- Marc J. Ouellette
- Germán Ros
- Zhi-Song Liu
- Sanskar Agrawal
- Daniel Maurer
- Michael Breuß
- Kai Zhang
- Li Jia
- Xiaowen Li
- Chenyu Wu
Venues
- Remote. Sens.
- CoRR
- IEEE Trans. Pattern Anal. Mach. Intell.
- IGARSS
- MVA
- Int. J. Comput. Vis.
- CVPR
- BMVC
- OFC
- EUSIPCO
- Pattern Recognit. Lett.
- Comput. Graph. Forum
- Sensors
- IEEE Trans. Geosci. Remote. Sens.
- ICIP (2)
- Rendering Techniques
- CIC
- IEICE Trans. Electron.
- ICST
- LMS J. Comput. Math.
- Central Eur. J. Oper. Res.
- Eurographics
- IEEE Computer Graphics and Applications
- Int. J. Softw. Innov.
- Pattern Anal. Appl.
- ICRA
- IWIS
- Edutainment
- Discret. Math.
- DAGM-Symposium
- IEEE Geosci. Remote. Sens. Lett.
- Pattern Recognit.
- Microelectron. Reliab.
- ICCSIE
- ETFA (2)
- ICCV
- CCBR
- IECON
- IbPRIA
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