LAMBERTIAN REFLECTANCE
Experts
- Toshikazu Wada
- Takashi Matsuyama
- Hiroyuki Ukida
- Edwin R. Hancock
- Marc J. Ouellette
- Shengbiao Wu
- Daniel Pak-Kong Lun
- João Pedro Barreto
- Hossein Ragheb
- Steven W. Zucker
- Michael Breuß
- Yong Chul Ju
- Li-Wen Wang
- Eugene Fiume
- Yixing Lao
- Tokiichiro Takahashi
- Shenlong Wang
- Michael S. Langer
- Chu-Tak Li
- Toshimitsu Tanaka
- Sanskar Agrawal
- Wan-Chi Siu
- Daniel Maurer
- Rene Sepúlveda
- Zhi-Song Liu
- Yves M. Govaerts
- Kai Zhang
- Qiang Liu
- Andrés Bruhn
- Diogo Roxo
- Tianhang Cheng
- Jianguang Wen
- Benjamin Ummenhofer
- Ravi Ramamoorthi
- Germán Ros
- Nuno Gonçalves
- Solveig Bruvoll
- Kyung-Soo Han
- Liisa Halonen
Venues
- Remote. Sens.
- CoRR
- IEEE Trans. Pattern Anal. Mach. Intell.
- IGARSS
- CVPR
- MVA
- BMVC
- Int. J. Comput. Vis.
- OFC
- IEICE Trans. Electron.
- ICIP (2)
- Comput. Graph. Forum
- IEEE Trans. Geosci. Remote. Sens.
- EUSIPCO
- Pattern Recognit. Lett.
- Sensors
- Rendering Techniques
- CIC
- IEICE Electron. Express
- Image Vis. Comput.
- SI3D
- OPTICS
- Eurographics
- Int. J. Softw. Innov.
- ECOC
- VRST
- IEEE Open J. Commun. Soc.
- ICCV
- Displays
- IAS
- ECCV Workshops (3)
- Central Eur. J. Oper. Res.
- Color Imaging Conference
- Neural Process. Lett.
- Microelectron. Reliab.
- J. Aerosp. Inf. Syst.
- ICST
- IECON
- SIGGRAPH Talks
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