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Youlong Lv
ORCID
Publication Activity (10 Years)
Years Active: 2011-2024
Publications (10 Years): 12
Top Topics
Imperialist Competitive Algorithm
Fault Detection
Assembly Line
Wafer Fabrication
Top Venues
Int. J. Prod. Res.
Sensors
IEEE Trans. Ind. Informatics
Int. J. Bio Inspired Comput.
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Publications
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Hongwei Xu
,
Wei Qin
,
Yan-Ning Sun
,
Youlong Lv
,
Jie Zhang
Attention mechanism-based deep learning for heat load prediction in blast furnace ironmaking process.
J. Intell. Manuf.
35 (3) (2024)
Hongwei Xu
,
Wei Qin
,
Yan-Ning Sun
,
Youlong Lv
,
Jie Zhang
An adaptive Copula function-based framework for fault detection in semiconductor wafer fabrication.
Comput. Ind. Eng.
188 (2024)
Hongwei Xu
,
Wei Qin
,
Jinhua Hu
,
Yan-Ning Sun
,
Youlong Lv
,
Jie Zhang
A Copula network deconvolution-based direct correlation disentangling framework for explainable fault detection in semiconductor wafer fabrication.
Adv. Eng. Informatics
59 (2024)
Junhong Qian
,
Youlong Lv
,
Yiping Gao
,
Junliang Wang
Frustum-LDGCNN: A High Efficient 3D Object Detection Network with Frustum Proposal.
CASE
(2023)
Yushi Qi
,
Chunhu Hu
,
Liling Zuo
,
Bo Yang
,
Youlong Lv
Cardiac Magnetic Resonance Image Segmentation Method Based on Multi-Scale Feature Fusion and Sequence Relationship Learning.
Sensors
23 (2) (2023)
Youlong Lv
,
Jie Zhang
,
Liling Zuo
Genetic regulatory network-based optimisation of master production scheduling and mixed-model sequencing in assembly lines.
Int. J. Bio Inspired Comput.
20 (3) (2022)
Hongwei Xu
,
Wei Qin
,
Youlong Lv
,
Jie Zhang
Data-Driven Adaptive Virtual Metrology for Yield Prediction in Multibatch Wafers.
IEEE Trans. Ind. Informatics
18 (12) (2022)
Hongwei Xu
,
Jie Zhang
,
Youlong Lv
,
Peng Zheng
Hybrid Feature Selection for Wafer Acceptance Test Parameters in Semiconductor Manufacturing.
IEEE Access
8 (2020)
Youlong Lv
,
Jie Zhang
,
Wei Qin
Simulation-based production analysis of mixed-model assembly lines with uncertain processing times.
J. Simulation
13 (1) (2019)
Youlong Lv
,
Wei Qin
,
Jungang Yang
,
Jie Zhang
Adjustment mode decision based on support vector data description and evidence theory for assembly lines.
Ind. Manag. Data Syst.
118 (8) (2018)
Haichao Wang
,
Jie Zhang
,
Youlong Lv
,
Xiaolong Zhang
,
Guoqiang Guo
,
Wei Qin
,
Xiaoxi Wang
Tool path optimisation method for large thin-wall part of spacecraft.
Int. J. Prod. Res.
56 (14) (2018)
Peng Zhang
,
Youlong Lv
,
Jie Zhang
An improved imperialist competitive algorithm based photolithography machines scheduling.
Int. J. Prod. Res.
56 (3) (2018)
Youlong Lv
,
Jie Zhang
Performance evaluation of knowledgeable manufacturing systems using Petri nets considering dynamic events.
IEEM
(2011)