Yadi Zhong

Publication Activity (10 Years)

Years Active: 2022-2023
Publications (10 Years): 11

Top Topics

Classical Logic

Propositional Satisfiability

Countermeasures

Fault Injection

Top Venues

ACM Great Lakes Symposium on VLSI

IACR Cryptol. ePrint Arch.

Publications

Yadi Zhong, Joshua Hovanes, Ujjwal Guin
On-Demand Device Authentication using Zero-Knowledge Proofs for Smart Systems. ACM Great Lakes Symposium on VLSI (2023)
Yadi Zhong, Ujjwal Guin
Complexity Analysis of the SAT Attack on Logic Locking. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42 (10) (2023)
Yadi Zhong, Ujjwal Guin
A Comprehensive Test Pattern Generation Approach Exploiting the SAT Attack for Logic Locking. IEEE Trans. Computers 72 (8) (2023)
Yadi Zhong, Ujjwal Guin
Fault-Injection Based Chosen-Plaintext Attacks on Multicycle AES Implementations. ACM Great Lakes Symposium on VLSI (2022)
Yadi Zhong, Ujjwal Guin
Complexity Analysis of the SAT Attack on Logic Locking. CoRR (2022)
Yadi Zhong, Ujjwal Guin
AFIA: ATPG-Guided Fault Injection Attack on Secure Logic Locking. CoRR (2022)
Joshua Hovanes, Yadi Zhong, Ujjwal Guin
Beware of Discarding Used SRAMs: Information is Stored Permanently. CoRR (2022)
Yadi Zhong, Ujjwal Guin
A Comprehensive Test Pattern Generation Approach Exploiting SAT Attack for Logic Locking. CoRR (2022)
Yadi Zhong, Ujjwal Guin
Complexity Analysis of the SAT Attack on Logic Locking. IACR Cryptol. ePrint Arch. 2022 (2022)
Yadi Zhong, Ujjwal Guin
Chosen-Plaintext Attack on Energy-Efficient Hardware Implementation of GIFT-COFB. HOST (2022)
Yadi Zhong, Ayush Jain, M. Tanjidur Rahman, Navid Asadizanjani, Jiafeng Xie, Ujjwal Guin
AFIA: ATPG-Guided Fault Injection Attack on Secure Logic Locking. J. Electron. Test. 38 (5) (2022)