A Comprehensive Test Pattern Generation Approach Exploiting the SAT Attack for Logic Locking.
Yadi ZhongUjjwal GuinPublished in: IEEE Trans. Computers (2023)
Keyphrases
- modal logic
- logic programming
- sat solvers
- concurrency control
- quantifier free
- satisfiability problem
- boolean satisfiability
- countermeasures
- sat instances
- sat problem
- computational properties
- logical framework
- automated reasoning
- sat solving
- asynchronous circuits
- max sat
- multi valued
- database
- phase transition
- search strategies
- data objects
- database systems