Y. T. He

Publication Activity (10 Years)

Years Active: 2004-2004
Publications (10 Years): 0

Publications

Y. T. He, M. A. J. van Gils, Willem D. van Driel, G. Q. Zhang, Richard B. R. van Silfhout, Leo J. Ernst
Prediction of crack growth in IC passivation layers. Microelectron. Reliab. 44 (12) (2004)