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Prediction of crack growth in IC passivation layers.
Y. T. He
M. A. J. van Gils
Willem D. van Driel
G. Q. Zhang
Richard B. R. van Silfhout
Leo J. Ernst
Published in:
Microelectron. Reliab. (2004)
Keyphrases
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prediction accuracy
prediction error
prediction algorithm
database
prediction model
integrated circuit
computer vision
real time
machine learning
social networks
decision trees
case study
three dimensional
artificial neural networks
hidden markov models