Xiangdong Xuan

Publication Activity (10 Years)

Years Active: 2001-2006
Publications (10 Years): 0

Publications

Xiangdong Xuan, Adit D. Singh, Abhijit Chatterjee
Lifetime Prediction and Design-for-Reliability of IC Interconnections with Electromigration Induced Degradation in the Presence of Manufacturing Defects. J. Electron. Test. 22 (4-6) (2006)
Xiangdong Xuan, Abhijit Chatterjee, Adit D. Singh
Application of local design-for-reliability techniques for reducing wear-out degradation of CMOS combinational logic circuits. ETS (2004)
Xiangdong Xuan, Abhijit Chatterjee, Adit D. Singh, Namsoo P. Kim, Mark T. Chisa
IC Reliability Simulator ARET and Its Application in Design-for-Reliability. Asian Test Symposium (2003)
Xiangdong Xuan, Abhijit Chatterjee
Sensitivity and Reliability Evaluation for Mixed-Signal ICs under Electromigration and Hot-Carrier Effects. DFT (2001)