Sign in
Lifetime Prediction and Design-for-Reliability of IC Interconnections with Electromigration Induced Degradation in the Presence of Manufacturing Defects.
Xiangdong Xuan
Adit D. Singh
Abhijit Chatterjee
Published in:
J. Electron. Test. (2006)
Keyphrases
</>
printed circuit boards
prediction accuracy
case study
manufacturing systems
computer aided
data sets
product development
neural network
design process
website
decision making
genetic algorithm
engineering design
high density
design space
product design
database
layout design