Tomasz Brozek

Publication Activity (10 Years)

Years Active: 2002-2024
Publications (10 Years): 3

Top Topics

Early Detection

Software Defect

Top Venues

Publications

Tomasz Brozek
Advanced Silicon Technologies: Design Consequences of Scaling Solutions for Devices. MIXDES (2024)
Meindert Lunenborg, Tomasz Brozek, Laura Lorenzi, Christoph Dolainsky, Violet Liu, Xiaoyi Feng
Short-Flow Compatible Wafer-Level Reliability Assessment and Monitoring for PCM Embedded Non-Volatile Memory. IRPS (2023)
Tomasz Brozek, Alberto A. P. Cattaneo, Larg Weiland, Michele Quarantelli, Alberto Coccoli, Sharad Saxena, Christopher Hess, Andrzej J. Strojwas
In-Product BTI Aging Sensor for Reliability Screening and Early Detection of Material at Risk. IRPS (2023)
Tomasz Brozek
Editorial. Microelectron. Reliab. 45 (1) (2005)
Mahesh S. Krishnan, Viktor Kol'dyaev, Eiji Morifoji, Koji Miyamoto, Tomasz Brozek, Xiaolei Li
Series resistance degradation due to NBTI in PMOSFET. Microelectron. Reliab. 42 (9-11) (2002)