Short-Flow Compatible Wafer-Level Reliability Assessment and Monitoring for PCM Embedded Non-Volatile Memory.
Meindert LunenborgTomasz BrozekLaura LorenziChristoph DolainskyViolet LiuXiaoyi FengPublished in: IRPS (2023)
Keyphrases
- reliability assessment
- main memory
- real time
- memory usage
- bp neural network model
- monitoring system
- memory requirements
- memory space
- machine learning
- flow patterns
- data storage
- software defect
- database
- limited memory
- computing power
- integrated circuit
- lower level
- flow field
- file system
- data acquisition
- higher level
- computational intelligence
- artificial intelligence
- data mining