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Series resistance degradation due to NBTI in PMOSFET.
Mahesh S. Krishnan
Viktor Kol'dyaev
Eiji Morifoji
Koji Miyamoto
Tomasz Brozek
Xiaolei Li
Published in:
Microelectron. Reliab. (2002)
Keyphrases
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pattern recognition
image degradation
data mining
case study
multiscale
video sequences
expert systems
image quality