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Series resistance degradation due to NBTI in PMOSFET.

Mahesh S. KrishnanViktor Kol'dyaevEiji MorifojiKoji MiyamotoTomasz BrozekXiaolei Li
Published in: Microelectron. Reliab. (2002)
Keyphrases
  • pattern recognition
  • image degradation
  • data mining
  • case study
  • multiscale
  • video sequences
  • expert systems
  • image quality