T. Riehle

Publication Activity (10 Years)

Years Active: 2023-2024
Publications (10 Years): 2

Top Topics

Bayes Error Rate

Information Theory

Top Venues

Publications

Balaji Narasimham, A-R. Montoya, C. Paone, T. Riehle, Mike Smith, Liming Tsau, Dennis R. Ball, Bharat L. Bhuva
Scaling Trends and Bias Dependence of SRAM SER from 16-nm to 3-nm FinFET. IRPS (2024)
Balaji Narasimham, H. Luk, C. Paone, A-R. Montoya, T. Riehle, Mike Smith, Liming Tsau
Scaling Trends and the Effect of Process Variations on the Soft Error Rate of advanced FinFET SRAMs. IRPS (2023)