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Scaling Trends and the Effect of Process Variations on the Soft Error Rate of advanced FinFET SRAMs.

Balaji NarasimhamH. LukC. PaoneA-R. MontoyaT. RiehleMike SmithLiming Tsau
Published in: IRPS (2023)
Keyphrases
  • error rate
  • test set
  • misclassification rate
  • pattern recognition
  • machine learning
  • information theory
  • equal error rate
  • bayes error rate