Sang Sik Park

Publication Activity (10 Years)

Years Active: 2004-2004
Publications (10 Years): 0

Publications

Hyuck In Kwon, In Man Kang, Byung-Gook Park, Jong Duk Lee, Sang Sik Park, Jung Chak Ahn, Yong Hee Lee
Effects of electrical stress on mid-gap interface trap density and capture cross sections in n-MOSFETs characterized by pulsed interface probing measurements. Microelectron. Reliab. 44 (1) (2004)