Ryan Lu

Publication Activity (10 Years)

Years Active: 2018-2024
Publications (10 Years): 6

Top Topics

Field Effect Transistors

Top Venues

Publications

Hsi-Yu Kuo, Yu-Lin Chu, Hung-Da Dai, Chun-Chi Wang, Pei-Jung Lin, Shu-Cheng Kuo, Ethan Guo, Ya-Min Zhang, Yu-Ti Su, Chia-Lin Hsu, Kuan-Hung Chen, Tsung-Yuan Chen, Te-Liang Li, Ray Huang, Kuo-Ji Chen, Ming-Hsiang Song, Ryan Lu, Kejun Xia
Layout Guidelines against Charging Damage from the Well-Side Antennas in Separated Power Domains. IRPS (2024)
Hsi-Yu Kuo, Yu-Lin Chu, Hung-Da Dai, Chun-Chi Wang, Pei-Jung Lin, Ethan Guo, Yu-Ti Su, Chia-Lin Hsu, Kuan-Hung Chen, Tsung-Yuan Chen, Ryan Lu, Victor Liang, Kuo-Ji Chen, Kejun Xia
Protection Schemes for Plasma Induced Damage from Well-Side Antennas. IRPS (2023)
Ryan Lu, Yao-Chun Chuang, Jyun-Lin Wu, Jun He
Reliability Challenges from 2.5D to 3DIC in Advanced Package Development. IRPS (2023)
A. S. Teng, C. W. Lin, M. N. Chang, Aaron Wang, Ryan Lu
A Novel Constant E-Field Methodology for Intrinsic TDDB Lifetime Projection. IRPS (2019)
D. S. Huang, J. H. Lee, Y. S. Tsai, Y. F. Wang, Y. S. Huang, C. K. Lin, Ryan Lu, Jun He
Comprehensive device and product level reliability studies on advanced CMOS technologies featuring 7nm high-k metal gate FinFET transistors. IRPS (2018)
I. K. Chen, S. C. Chen, S. Mukhopadhyay, D. S. Huang, J. H. Lee, Y. S. Tsai, Ryan Lu, Jun He
The physical mechanism investigation of off-state drain bias TDDB and its implication in advance HK/MG FinFETs. IRPS (2018)