Ronald J. Bolam

Publication Activity (10 Years)

Years Active: 1999-2005
Publications (10 Years): 0

Publications

Terence B. Hook, Ronald J. Bolam, William Clark, Jay S. Burnham, Nivo Rovedo, Laura Schutz
Negative bias temperature instability on three oxide thicknesses (1.4/2.2/5.2 nm) with nitridation variations and deuteration. Microelectron. Reliab. 45 (1) (2005)
Ghavam G. Shahidi, Atul Ajmera, Fariborz Assaderaghi, Ronald J. Bolam, Harold Hovel, Effendi Leobandung, Werner Rausch, Devendra Sadana, Dominic Schepis, Lawrence F. Wagner, Larry Wissel, Kun Wu, Bijan Davai
Device and circuit design issues in SOI technology. CICC (1999)
Terence B. Hook, Jay S. Burnham, Ronald J. Bolam
Nitrided gate oxides for 3.3-V logic application: Reliability and device design considerations. IBM J. Res. Dev. 43 (3) (1999)